Spherical near-field scanning experimental and theoretical studies by Ronald C. Wittmann

Cover of: Spherical near-field scanning | Ronald C. Wittmann

Published by U.S. Dept. of Commerce, National Institute of Standards and Technology, Order from National Technical Information Service in Boulder, Colo, [Springfield, VA .

Written in English

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Subjects:

  • Microwave antennas -- Testing.

Edition Notes

Book details

Other titlesSpherical near field scanning.
StatementRonald C. Wittmann, Carl F. Stubenrauch.
SeriesNISTIR -- 3955.
ContributionsStubenrauch, Carl F., National Institute of Standards and Technology (U.S.)
The Physical Object
Paginationxi, 114 p. :
Number of Pages114
ID Numbers
Open LibraryOL15385687M

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Spherical Near-Field Scanner Systems NSI-MI's offers a large variety of Spherical Near-Field Antenna Measurement Systems of various sizes and configurations. The most common is the “Roll over Azimuth” systems where the AUT is mounted on the Roll positioner, which in turn is mounted on an L-bracket, mounted on a Theta positioner.

Spherical Near-field Antenna Measurements. Buy e-book PDF. £ (plus tax if applicable) The compact range as well as near-field scanning ranges in planar, cylindrical and spherical geometries have all more or less reached mature states.

matrix theory for antennas is the obvious tool for analyzing the interaction between the test. Get this from a library. Spherical near-field scanning: experimental and theoretical studies.

[Ronald C Wittmann; Carl F Stubenrauch; National Institute of Standards and Technology (U.S.)]. Spherical Near-Field Scanning: Experimental and Theoretical Studies. Published. July 1, Author(s) Ronald C. Wittmann, Carl Spherical near-field scanning book.

Stubenrauch. Citation. NIST Interagency/Internal Report (NISTIR) - Report Number. NIST Pub Series. NIST Interagency/Internal Report (NISTIR)Cited by: The subject of antenna measurements is one which has undergone revolutionary changes in recent years, in particular within space applications, where high demands are placed upon antenna design and construction.

This book represents the specific measurement technique known as the spherical near-field method. The theoretical treatment of the method is detailed but of sufficient generality to 5/5(2). Conventional far-field measurement ranges often are not adequate for testing such antennas accurately.

Near-field measurement techniques have been developed to increase accuracy, throughput, lower costs, and provide antenna diagnostics. The most commonly. Description. Large Cylindrical Near-field Measurement Systems are ideal for measuring broad beam (azimuth) antennas Spherical near-field scanning book apertures less than fifty twp feet making them ideal for testing stacked linear arrays, cellular and PCS antennas as well as higher frequency antennas with larger apertures.

Hansen has also formulated planar and spherical near-field scanning techniques in the time domain, and derived exact beam representations that are alternatives to the classical multipole expansions. His recent work includes forward and inverse scattering problems for ground-penetrating and subsurface radars.

A number of methods for measuring antenna performance at reduced distances are described, including: modal expansion techniques; plane wave synthesis; and suppressed ground reflection. Consideration is also given to: probe sampling, extended information processing; finite distance focusing; and spherical sampling.

The results of experiments with a spherical scanner developed for the ESA in Author: F. Larsen. This paper will show both fieldprobing and spherical near-field scanning measurements where MuSiC and combining mode rotation with CLEAN algorithms are used respectively for the detection of.

NBSIR NON-PLANARNEAR-FIELDMEASUREMENTS: SPHERICALSCANNING Electromagr Institutefor NationalBui Boulder,Co merits:Sphericalscanning^AFAL-TR ^Z)pages(AirForceAvici^icsLaboratory, Airr^z^rceSystemsCommand^Wright-Patterson ^orceBase J Ohio^ ) June SupportinPartby: AirForceAvionicsLaboratory WrightPattersonAirForceBase.

Abstract. Spherical near-field scanning techniques are formulated for acoustic and electromagnetic fields in the time domain so that a single set of time-domain near-field measurements yields the far field in the time domain or over a wide range of by: 4.

Book. Jan ; Rasmus Cornelius Spherical near-field scanning is a standard method to measure the radiation characteristic of an antenna under test (AUT). a spherical near-field far-field. Spherical Near-Field Scanning with Higher Order Probes.

A general method for higher-order probe correction in spherical scanning is obtained from a renormalized least-squares approach. The.

renormalization causes the normal matrix of the least-squares problem to closely resemble the identity matrix when most of the energy of the. We introduce a near-field, spherical-scanning algorithm for antenna measurements that relaxes the usual condition requiring data points to be on a regular spherical grid.

Computational complexity is of the same order as for the standard (ideal-positioning) spherical-scanning technique. The new procedure has been tested extensively. Within high-frequency diffraction theory, he has developed methods for calculating scattering from corners, narrow grooves, and shadow boundaries.

Hansen has also formulated planar and spherical near-field scanning techniques in the time domain, and derived exact beam representations that are alternatives to the classical multipole expansions. This book represents the specific measurement technique known as the spherical near-field method.

The theoretical treatment of the method is detailed but of sufficient generality to make the book useful as a basis for further research on near-field measurements and antenna coupling problems. Roll over Azimuth Scanner Systems Swing Arm over Azimuth Systems Stationary AUT Systems Arch Over Azimuth Scanner Systems All Spherical Near-Field Scanner Systems: Spherical Near-Field Imaging Technique.

Characterizing anechoic chambers using Spherical Near-Field Imaging requires RF magnitude and phase measurements of the electromagnetic field across a spherical surface that is centered in the anechoic chamber’s quiet zone.

A probe antenna is mounted on aFile Size: KB. development of a spherical near-field to far-field transform that can efficiently process data acquired on a non-uniform grid.

Keywords: Spherical Near-Field Measurements, uniform-grid, spiral scan, fast algorithms. Introduction. When scanning over a spherical surface, near-field. Electromagnetic near-field scanner is a measurement system to determine a spatial distribution of an electrical quantity provided by a single or multiple field probes acquired in the near-field region of a device under test possibly accompanied by the associated numerical post-processing methods enabling a conversion of the measured quantity into electromagnetic field.

spherical near field antenna measurements download The theory of spherical near-field SNF scanning was developed in the. spherical near field antenna measurements book Probe-corrected spherical near-field antenna measurements at.

Hansen 44 points out, a far-field distance of at least 6D2X IN SPHERICAL NEAR-FIELD ANTENNA MEASUREMENTS. scanning initiated the development of practical, accurate near-field measurement techniques.

Since that time, the theory for probe-corrected near-field measurements has been successfully formulated and applied to the measurement of electromagnetic and acoustic radiators on planar [28]—[31], cylindrical [32], [33], and spherical [34]-[ Near-field scanning optical microscopy (NSOM) or scanning near-field optical microscopy (SNOM) is a microscopy technique for nanostructure investigation that breaks the far field resolution limit by exploiting the properties of evanescent SNOM, the excitation laser light is focused through an aperture with a diameter smaller than the excitation wavelength, resulting in an evanescent.

Non-planar near-field measurements: spherical scanning Item Preview remove-circle Non-planar near-field measurements: spherical scanning by Wacker, Paul F.

Publisher National Bureau of Standards English Volume NBSIR Notes. No copyright page found. Page 47 is cropped in the physical book. Addeddate The field expansions and probe characterizations used in all the previous work on probe-corrected near-field scanning have been based on the classical planar, cylindrical, and spherical waves.

Complex point sources are exact directional wave fields obtained by an analytical extension of a Green’s function into complex space [22].Cited by: 9.

Two efficient probe-compensated near-field-far-field transformations with spherical scanning for antennas having two dimensions very different from the third one are here developed.

They rely on the nonredundant sampling representations of the electromagnetic fields and on the optimal sampling interpolation expansions, and use effective antenna by: F. D'Agostino, F. Ferrara, C. Gennarelli, R. Guerriero, and M. Migliozzi, “Experimental testing of nonredundant near-field to far-field transformations with spherical scanning using flexible modellings for nonvolumetric antennas,” International Journal of Antennas and Propagation, vol.

Article ID10 pages, Cited by: Electrical Engineering Plane-Wave Theory of Time-Domain Fields Near-Field Scanning Applications A volume in the IEEE Press Series on Electromagnetic Wave Theory Donald G. Dudley, Series Editor Plane-Wave Theory of Time-Domain Fields provides a comprehensive framework for the formulation and solution of numerous problems involving the radiation Cited by: cylindrical scanning technique whereby the test antenna may simply be rotated in azimuth and the probe moved in steps along a vertical line.

Three major approaches have been used to transform the measured near-field data fo computed far-field characteristics. Within high-frequency diffraction theory, he has developed methods for calculating scattering from corners, narrow grooves, and shadow boundaries.

Hansen has also formulated planar and spherical near-field scanning techniques in the time domain, and derived exact beam representations that are alternatives to the classical multipole expansions.3/5(1). Review of spherical near-field transformations References Measurements Introduction Probes for near-field scanning Introduction Rotationally Symmetrie probes Polarization correction Polarization calibration Pattern calibration Probe-corrected measurements Near-Field Scanning Optical Microscopy - Selected Literature References Section Overview: A number of books and review articles covering important topics in near-field scanning optical microscopy have been published by leading researchers in the field.

Wacker and A. Newell, “Advantages and disadvantages of planar, circular cylindrical, and spherical scanning and description of the NBS antenna scanning facilities,” ESA Preprint SP, pp.

–, Workshop on Antenna Testing Techniques held at ESTEC, European Space Agency, Noordwijk, The Netherlands, June 6–8, Google ScholarCited by: 4. IEEE International Symposium on Phased Array Systems and TechnologyOctober 15 - 18,Waltham, MA USA Tutorial: Phased Array Measurements Octo 8 A.M.

- 12 noonInstructors: Dr. Alan Fenn, MIT Lincoln LaboratoryDr. Charles Kryzak, Alion Science and TechnologyMr. Alexander Morris, MIT Lincoln LaboratoryOverview: Accurate characterization of RF phased array antenna.

Near-field scanning optical microscopy is classified among a much broader instrumental group referred to generally as scanning probe microscopes (SPMs). All SPMs owe their existence to the development of the scanning tunneling microscope (STM), which was invented by IBM research scientists Gerd Binnig and Heinrich Rohrer in the early s.

KLIPPEL, WARKWYN: Near field scanning, 4 AGENDA 1. Pros and Cons of Conventional Loudspeaker Measurements 2. New Requirements for Comprehensive 3D Directivity Data 3. Introduction to Directivity Measurements 4. Near Field Measurements can be Beneficial. A New and Better Way using Near Field Scanning 6.

What is Spherical Harmonic Wave. scanning. Among these groups, spherical scanning is the most popular one and is applied in this work. Spherical near-field testing is developed relatively thoroughly by Hansen [1]. In addition, Jensen, Engen also made considerable contribution to this field.

Besides. eral guidelines. Spherical near field (SNF) ranges can test antennas as small as /2. But for such a small an - tenna it may be a better approach to use a far field illumination range as it relates to the typical electrical size of the AUT. When creating an anechoic chamber, the goal is to obtain a.

Introduction. Near-field scanning optical microscopy (NSOM), also known as scanning near-field optical microscopy (SNOM), is a scanning probe technique developed to surpass the spatial resolution constraints that traditionally limit conventional optical microscopy (1–11).As shown in Fig.

1, NSOM uses fiber optic probes to funnel light down to the nanometric by: 5. Schwartz, "Principles of Near-Field Microwave Microscopy," in Scanning Probe Microscopy: Electrical and Electromechanical Phenomena at the Nanoscale, Volume 1, edited by S. V. Kalinin and A. Gruverman (Springer-Verlag, New York,ISBN: ), pages Near-field microwave microscopy is concerned with quantitative measurement.Near-Field Scanning Optical Microscopy Literature References.

Near-field scanning microscopy techniques probe the specimen within the region having a radius much shorter than the illumination wavelength. These instruments achieve superresolution imaging by exploiting the unique properties of evanescent waves and can produce resolution that is.Near-Field Scanning Optical Microscopy.

For ultra-high optical resolution, near-field scanning optical microscopy (NSOM) is currently the photonic instrument of -field imaging occurs when a sub-micron optical probe is positioned a very short distance from the sample and light is transmitted through a small aperture at the tip of this probe.

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